| Category |
Title / Sections |
Scholar |
Branch of Study |
Year |
| Page |
2.8.2 Quartz crystal thickness monitor. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films ) |
Krishnakumar, S |
Physics |
1995 |
| Page |
Fig.2.7. Block diagram of a quartz crystal thickness monitor. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films |
Krishnakumar, S |
Physics |
1995 |
| Page |
2.9 Measurement of electrical characteristics.. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films ) |
Krishnakumar, S |
Physics |
1995 |
| Page |
2.9.1 conductivity measurements. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films |
Krishnakumar, S |
Physics |
1995 |
| Page |
2.9.2 conductivity cell. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films ) |
Krishnakumar, S |
Physics |
1995 |
| Page |
Fig.2.8. Schematic diagram of electrical conductivity measurement. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films |
Krishnakumar, S |
Physics |
1995 |
| Page |
Fig.2.9. Schematic diagram of the cross-section ofthe conductivity cell.. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films ) |
Krishnakumar, S |
Physics |
1995 |
| Page |
2.9.4 capacitance measurements. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films |
Krishnakumar, S |
Physics |
1995 |
| Page |
2.10 Measurement of optical characteristics. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films ) |
Krishnakumar, S |
Physics |
1995 |
| Page |
Fig.2.11. Electrical connection of Keithley programmable (model No. 617) electrometer for capacitance measurement.. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films |
Krishnakumar, S |
Physics |
1995 |
| Page |
2.11 Measurement of thermal characteristics. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films ) |
Krishnakumar, S |
Physics |
1995 |
| Page |
3.3.1 Dc electrical conductivity in coplanar geometry. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films |
Krishnakumar, S |
Physics |
1995 |
| Page |
Fig.3.1. Plot of log σ vs. 1/T for MoO3 films of thicknesses 165nm, 187nm, and 208nm coplanar geometry. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films ) |
Krishnakumar, S |
Physics |
1995 |
| Page |
Fig.3.2. Plot of log σ vs. 1/T for V2O2 films of thicknesses 45nm, 74nm, and 164nm in coplanar geometry. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films |
Krishnakumar, S |
Physics |
1995 |
| Page |
Fig.3.3. Plot of log σ vs 1/T for TiO2 films of thicknesses 94nm, 110nm and 153nm in coplanar geometry. (Thesis: Studies on the electrical, optical and thermal properties of Molybdenum trioxide, Vanadium pentoxide and Titanium dioxide thin films ) |
Krishnakumar, S |
Physics |
1995 |
