| Category |
Title / Sections |
Scholar |
Branch of Study |
Year |
| Page |
2.9 Substrate cleaning. (Thesis: Studies on the electrical, optical and structural properties of Indium oxide, Tin oxide and Indium Tin oxide thin films ) |
Joseph George |
Physics |
1997 |
| Page |
Fig. 2.4 Schematic diagram of a vacuum coating unit.. (Thesis: Studies on the electrical, optical and structural properties of Indium oxide, Tin oxide and Indium Tin oxide thin films |
Joseph George |
Physics |
1997 |
| Page |
Fig.2.6 Block diagram of the temperature controller cum recorder. (Thesis: Studies on the electrical, optical and structural properties of Indium oxide, Tin oxide and Indium Tin oxide thin films ) |
Joseph George |
Physics |
1997 |
| Page |
2.16 Quartz crystal Thickness Monitor. (Thesis: Studies on the electrical, optical and structural properties of Indium oxide, Tin oxide and Indium Tin oxide thin films |
Joseph George |
Physics |
1997 |
| Page |
Fig.2.8 Block diagram of a quartz crystal thickness monitor. (Thesis: Studies on the electrical, optical and structural properties of Indium oxide, Tin oxide and Indium Tin oxide thin films ) |
Joseph George |
Physics |
1997 |
| Page |
2.17 Measurement of Electrical conductivity. (Thesis: Studies on the electrical, optical and structural properties of Indium oxide, Tin oxide and Indium Tin oxide thin films |
Joseph George |
Physics |
1997 |
| Page |
Fig. 2. 9 Schematic diagram of electrical conductivitymeasurements. All dimensions are in mm.. (Thesis: Studies on the electrical, optical and structural properties of Indium oxide, Tin oxide and Indium Tin oxide thin films ) |
Joseph George |
Physics |
1997 |
| Page |
2.18 conductivity cell. (Thesis: Studies on the electrical, optical and structural properties of Indium oxide, Tin oxide and Indium Tin oxide thin films |
Joseph George |
Physics |
1997 |
| Page |
Fig. 2.10 Schematic diagram of the cross-section of theconductivity cell.. (Thesis: Studies on the electrical, optical and structural properties of Indium oxide, Tin oxide and Indium Tin oxide thin films ) |
Joseph George |
Physics |
1997 |
| Page |
cERTIFIcATE. (Thesis: Parametric approach to structural analysis of simple molecules using spectroscopic data |
Indira, K |
Physics |
1998 |
| Page |
cONTENTS. (Thesis: Parametric approach to structural analysis of simple molecules using spectroscopic data ) |
Indira, K |
Physics |
1998 |
| Page |
2. A NEW cRITERION FOR MOLEcULAR GEOMETRY. (Thesis: Parametric approach to structural analysis of simple molecules using spectroscopic data |
Indira, K |
Physics |
1998 |
| Page |
2.2 SYMMETRY cONSIDERATIONS. (Thesis: Parametric approach to structural analysis of simple molecules using spectroscopic data ) |
Indira, K |
Physics |
1998 |
| Page |
2.7 AN APPROXIMATION cRITERION. (Thesis: Parametric approach to structural analysis of simple molecules using spectroscopic data |
Indira, K |
Physics |
1998 |
| Page |
Table II.2 Inter bond angle determined from Bending Energy considerations. (Thesis: Parametric approach to structural analysis of simple molecules using spectroscopic data ) |
Indira, K |
Physics |
1998 |
